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The TES-8653D is a highly reliable Surface Mount Device Test Handler. Specifically designed to operate in various semiconductor manufacturing environment. * Epoch making Cam Mechanism for higher throughput. -1100UPH with 1 sec. test time. (Ambient Mode: 28X28mm and smaller packages) * Horizontal pick and place transfer and gravity feed for less lead damage. * Applicable to mass-production lin- using Input/Output(Bin 1) tray elevators. * Reliable high temperature performance (+60°C-+155°C) * Larger soak buffer for high temperature operation * Applicable to any SMDs in trays * Tray fixing mechanism for precise tray alignment * Device conversion in as little as 15 minutes. The SMD handler is designed to interface with outside testers to provide rapid testing of semiconductor devices in a controlled emvironment. Some of these testers are: Trillium, Advantest, Megatest, Ando, Teradyne, HP andCentry. The handler individually transfers untested devices to an area where they may undergo testing procedures, and then be properly sorted depending upon results of these procedures. This automatic testing operation permits the user to constantly monitor condition of handler with use of visual readout display. Temperature controller allows for heating devices to meet special requirements. This unique SMD test handler uses a special Z80 processor that directs the handler operation through the use of special monitoring sensors. With special desigh application change kit, the handler can adapt to various SMD packages. All maintenance procedures have been designed for minimum downtime. All components have been selected to provide maximum reliability at component level. Because of these design features, theTES-8653D is extremely cost effective for all semiconductor SMD applications. This unit can also be customized to meet specific standards. Allows for address access to pin-point areas of handler. Used primarily for trubleshooting. Compressed: 64psi dry air required QFP, VQFP, SQFP, PQFP, PLCC, LCC & PGA Tray (Outer size: 135 X 315mm) 2.3 sec. (Test Time > or = 1 sec.) 3.3 sec. (Test Time > = 1 sec.) Tested Devices < or = 100V (at RH : 45%) Input & Bin 1 & Compartment for extra trays are Elevator Driven Used in production environment allows for on-line interface with outside tester control. Allows self control with the use of remote controls Allows for offline demonstration Allows control of 4 stages of heating environment at temperatures between +60°C-+155°C (t3°C at test site) Use of sensors located throughout handler, monitors constant status to provide information to visual readout display. Automatic up/down of handler for soft docking to test head. (Z-UP height: 8" from 42") Controls temperature of handler's 4 heating sites and becomes on-line after approx. 30-minute stabilization time. (from 25'C to 125°C) Total Machine throughput Indicator [Click any photo for larger image] (please look at our rules and privacy policy) |
N-thornton@machine--tools.com (Nola Thornton) for additional information. This email is used for forwarding to newsgroup user.
