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THE SEMICONDUCTOR CURVE TRACER DISPLAYS A FAMILY OF DYNAMIC CHARACTERISTIC CURVES FOR TRANSISTORS. FET’S, DIODES, TRIACS, TUNNEL DIODES AND ALL OTHER SEMICONDUCTOR DEVICES ON THE SCREEN OF THE OSCILLOSCOPE. MOST AUTHORITIES AGREE THAT A DYNAMIC CURVE TRACER IS THE BEST INSTRUMENT FOR TESTING SEMI-CONDUCTORS, SINCE IT SIMULATES ACTUAL OPERATING CONDITIONS SINCE IT SIMULATES ACTUAL OPERATING CONDITIONS OF CHANGING VOLTAGE AND CURRENT. SOME OF THE CHARACTERISTICS, WHICH MAY BE MEASURED, ARE GAIN (BETA), LEAKAGE, BREAKDOWN VOLTAGE, OUTPUT ADMITTANCE, LINEARITY, EFFECTS OF CAPACITANCE AND EFFECTS OF TEMPERATURE. THE SPECIAL 3-TIP PROBE SUPPLIED WITH THE UNIT SIMPLIFIES IN-CIRCUIT TESTING BY CONTACTING BASE, COLLECTOR AND EMITTER SIMULTANEOUSLY WITH A SINGLE PROBE. THIS IS VERY CONVENIENT FOR TESTING TRANSISTORS MOUNTED ON CIRCUIT BOARDS. IF YOU HAVE ANY QUESTIONS PLEASE FEEL FREE TO E-MAIL ME! (please look at our rules and privacy policy) |
Hester_Barry@machine--tools.com (Hester Barry) for additional information. This email is used for forwarding to newsgroup user.
