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The SCANIO-280LV Digital tester module provides a low cost alternative to traditional stimulus response digital testing. test channels with virtually unlimited memory depth per pin. this module uses boundary-scan gate arrays to add control and visibility to connectors, traces and logic that are otherwise untestable sing boundary-scan techniques. The SCANIO-280, combined with a boundary-scan controller such as the Corelis PCI-1149.1, PC-1149.1/100F, or net-1149.1, operates as a traditional "bed of nails" test system except access to the stimulus-and-response I/Os is accomplished using boundary-scan technology. Each pin can be individually configured as an input, output, or tri-state. Blocks of 144 I/o channels can be bypassed (using the boundary-scan bypass command), thus reducing the number of channels to fit the number of UUT I/O's. reducing the number of I/O channels reduces test times which can be important in time-critical test applications. includes manual (a copy).. this has been opened but never used. (please look at our rules and privacy policy) |
BernadetteLester@machine--tools.com (Bernadette Lester) for additional information. This email is used for forwarding to newsgroup user.
